Second Workshop on Mutation Analysis (Mutation2006) in conjunction with ISSRE'06

Call for paper

Program

Important dates

Submission deadline: August 21, 2006
Notification of acceptance: September 12, 2006
Final version due: September 29, 2006
Workshop day: November 7, 2006

Workshop Organizers

Yves Le Traon (France Telecom R&D, France)
Eric Wong (University of Texas at Dallas, USA)
Benoit Baudry (IRISA / INRIA, France)

Program Committee

Roger Alexander, USA
Jamie Andrews, Canada
Fevzi Belli, Germany
Lionel Briand, Canada
Byoungju Choi, Korea
John Clark, UK
Sudipto Ghosh, USA
Mark Harman, UK
Bill Howden, USA
Yong-Rae Kwon, Korea
Jose' Carlos Maldonado, Brazil
Aditya Mathur, USA
Jeff Offutt, USA
Vadim Okun, USA
Helene Waeselynck, France

In 2000, the first symposium on mutation testing had brought together researchers and practitioners to exchange ideas about practical and theoretical aspects of mutation testing. Since then, mutation testing and mutation analysis have been very active fields for research. Their application scope has been broadened to object-oriented systems, real-time modelling or model-checking. Mutation is a common technique to validate a set of test cases or to evaluate new testing approaches. The workshop focuses on both the current state of the research and novel approaches for mutation analysis and other approaches for test qualification.

Researchers and practitioners are invited to submit original manuscripts of either full paper or short paper describing work in any of the following areas:

  • Mutation-based test adequacy criteria
  • Effectiveness of mutation
  • Comparison of mutation with other testing techniques
  • Tools for mutation
  • Experience with mutation
  • Mutation for QoS properties (security, performances...)
  • Mutation for model-driven approaches
  • Novel applications of mutation
  • Other test qualification techniques

All submissions must be made electronically in Word or PDF format. Each submission should include title, all authors' names, affiliations, and complete mail and electronic mail addresses, together with an abstract not exceeding 200 words and keyword list of 4 - 5 keywords. Final versions of accepted papers will be limited to 10 pages for full papers and 4-6 pages for short papers. All submissions should be made online at the submission page (http://dartagnan.csc.ncsu.edu:8080/Mutation06/submit.html)with the IEEE format.

The best paper will be proposed for publication in the Empirical Software Engineering journal, and be considered in the best papers selection of ISSRE 2006. To be eligible, the paper must have a substantial empirical content, given the journal's scope (no purely tool or theory paper).