Cui15b

L. Cui, E. Marchand. Scanning electron microscope calibration using a multi-image non-linear minimization process. Int. Journal of Optomechatronics, 9(2):151-169, May 2015.

Download [help]

Download paper: Doi page

Download Hal paper:

Download paper: Adobe portable document (pdf)

Copyright notice:

This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. These works may not be reposted without the explicit permission of the copyright holder. This page is automatically generated by bib2html v217, © Inria 2002-2015, Projet Lagadic

Contact

Éric Marchand

BibTex Reference

@article{Cui15b,
   Author = {Cui, L. and Marchand, E.},
   Title = {Scanning electron microscope calibration using a multi-image non-linear minimization process},
   Journal = {Int. Journal of Optomechatronics},
   Volume = {9},
   Number = {2},
   Pages = {151--169},
   Month = {May},
   Year = {2015}
}

EndNote Reference [help]

Get EndNote Reference (.ref)