A. Chessel, B. Cinquin, F. Waharte, Ch. Kervrann, J. Salamero. A detection based framework for systematic analysis of dual color TIRF microscopy. In Focus on Microscopy (FOM'10), Shanghai, China, March 2010.
Anatole Chessel
Charles Kervrann
@InProceedings{Chessel10b,
Author = {Chessel, A. and Cinquin, B. and Waharte, F. and Kervrann, Ch. and Salamero, J.},
Title = {A detection based framework for systematic analysis of dual color TIRF microscopy},
BookTitle = {Focus on Microscopy (FOM'10)},
Address = {Shanghai, China},
Month = {March},
Year = {2010}
}
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