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Michèle Basseville, Laurent Mevel, Maurice Goursat, Statistical model-based damage detection and localization : subspace-based residuals and damage-to-noise sensitivity ratios, Research Report INRIA, No 4645, February 2002.

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Michele Basseville
Michele.Basseville@irisa.fr

Laurent Mevel
Laurent.Mevel@irisa.fr

Maurice Goursat
Maurice.Goursat@inria.fr

BibTex Reference

@TechReport{basseville-pi1470,
   Author = {Basseville, Michèle and Mevel, Laurent and Goursat, Maurice},
   Title = {Statistical model-based damage detection and localization : subspace-based residuals and damage-to-noise sensitivity ratios},
   Number = {4645},
   Institution = {INRIA},
   Month = {February},
   Year = {2002}
}

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