Thibaud Toullier, Jean Dumoulin, Laurent Mevel. Study of measurements bias due to environmental and spatial discretization in long term thermal monitoring of structures by infrared thermography. In QIRT 2018 - 14th Quantitative InfraRed Thermography Conference, Berlin, Germany, June 2018.
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Laurent Mevel http://www.irisa.fr/i4s
@InProceedings{toullier:hal-01890292,
Author = {Toullier, Thibaud and Dumoulin, Jean and Mevel, Laurent},
Title = {{Study of measurements bias due to environmental and spatial discretization in long term thermal monitoring of structures by infrared thermography}},
BookTitle = {{QIRT 2018 - 14th Quantitative InfraRed Thermography Conference}},
Address = {Berlin, Germany},
Month = {June},
Year = {2018}
}
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