Michèle Basseville, Laurent Mevel, Maurice Goursat. Statistical model-based damage detection and localization : subspace-based residuals and damage-to-noise sensitivity ratios. Research Report INRIA, No 4645, February 2002.
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Laurent Mevel http://www.irisa.fr/i4s
Maurice Goursat http://www.irisa.fr/i4s
@TechReport{basseville-pi1470,
Author = {Basseville, Michèle and Mevel, Laurent and Goursat, Maurice},
Title = {Statistical model-based damage detection and localization : subspace-based residuals and damage-to-noise sensitivity ratios},
Number = {4645},
Institution = {INRIA},
Month = {February},
Year = {2002}
}
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