Saeid Allahdadian, Michael Döhler, Carlos Ventura, Laurent Mevel. On the influence of sample length and measurement noise on the stochastic subspace damage detection technique. IMAC - 34th International Modal Analysis Conference, Orlando, FL, United States, January 2016.
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Laurent Mevel http://www.irisa.fr/i4s
@Misc{allahdadian:hal-01262256,
Author = {Allahdadian, Saeid and Döhler, Michael and Ventura, Carlos and Mevel, Laurent},
Title = {{On the influence of sample length and measurement noise on the stochastic subspace damage detection technique}},
BookTitle = {{IMAC - 34th International Modal Analysis Conference}},
Address = {Orlando, FL, United States},
Month = {January},
Year = {2016}
}
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